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Instrument name: Tecnai G2 F20 U-TWIN Transmission Electron Microscope (Tecnai G2 F20 U-TWIN TEM)

Manufacturer: FEI Company

Specifications:

•Electron source: Schottky field emitter

•Maximum accelerating voltage: 200 kV

•Point resolution: 0.19 nm

•Line resolution: 0.102 nm

•Information limit: 0.12 nm

•STEM HAADF resolution: 0.14 nm

•Magnification range: 25 x - 1,000 kx

•Maximum tilt angle: ±24°

•Minimum energy spread: 0.7 eV or less

•EDX resolution: 136ev  

Accessories:

•Gatan GIF Tridiem energy filter

•Gatan 894 CCD camera

•STEM system and HAADF detector

•EDX detector

Functions:

High performance in TEM imaging, STEM imaging and Nano-Analysis, including BF, DF, HRTEM, SAED, STEM-HAADF, EELS, EFTEM, EDX, etc.

It is optimized for complete materials characterization by combining HRTEM with HRSTEM and advanced spectrum imaging in EELS and EDX.

For further information, please contact Dr. QI Xiaoying. Tel: +86-10-82545516, email: qixy@nanoctr.cn

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