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Welcome to ourNCNST

Introduction ofNCNST

The National Center for Nanoscience and Technology(NCNST) of China is co-founded by Chinese Academy of Sciences (CAS) and Ministry of Education . It is a subsidiary non-profit organization of CAS which enjoys full financial allocations with a status of independent non-profit legal entity.


Scanning Probe Microscope (Veeco –MultiMode)

The MultiMode scanning probe microscope performs the full range of scanning probe microscopy techniques to measure surface characteristics, including topography, elasticity, friction, adhesion, electrical/magnetic fields, electrochemical, thermal, and electrical fields. The modes are Tapping Mode and Contact Mode AFM, Phase Imaging, Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), Scanning Tunneling Microscopy (STM), Force Modulation, Electric Force Microscopy (EFM). 

For further information, please contact Ms. ZHU Xiaoyang. Tel: +86-10-82545517, email: zhuxy@nanoctr.cn

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