The MultiMode scanning probe microscope performs the full range of scanning probe microscopy techniques to measure surface characteristics, including topography, elasticity, friction, adhesion, electrical/magnetic fields, electrochemical, thermal, and electrical fields. The modes are Tapping Mode and Contact Mode AFM, Phase Imaging, Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), Scanning Tunneling Microscopy (STM), Force Modulation, Electric Force Microscopy (EFM).
For further information, please contact Ms. ZHU Xiaoyang. Tel: +86-10-82545517, email: zhuxy@nanoctr.cn
The MultiMode scanning probe microscope performs the full range of scanning probe microscopy techniques to measure surface characteristics, including topography, elasticity, friction, adhesion, electrical/magnetic fields, electrochemical, thermal, and electrical fields. The modes are Tapping Mode and Contact Mode AFM, Phase Imaging, Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), Scanning Tunneling Microscopy (STM), Force Modulation, Electric Force Microscopy (EFM).
For further information, please contact Ms. ZHU Xiaoyang. Tel: +86-10-82545517, email: zhuxy@nanoctr.cn
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