4200-SCS Semiconductor Characterization System
The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests.
Related Applications:
Semiconductor Devices, Wafer level reliability, C-V/I-V characterization, Optoelectronic Devices
For further information, please contact Mr. WANG Dongwei. Tel: +86-10-82545516, email: wangdw@nanoctr.cn
4200-SCS Semiconductor Characterization System
The easy-to-use Model 4200-SCS Semiconductor Characterization System performs lab grade DC and characterization, real-time plotting, and analysis with high precision and sub-femtoamp resolution. The 4200-SCS offers the most advanced capabilities available in a fully integrated characterization system, including a complete, embedded PC with Windows operating system and mass storage. Its self-documenting, point-and-click interface speeds and simplifies the process of taking data, so users can begin analyzing their results sooner. Additional features enable stress-measure capabilities suitable for a variety of reliability tests.
Related Applications:
Semiconductor Devices, Wafer level reliability, C-V/I-V characterization, Optoelectronic Devices
For further information, please contact Mr. WANG Dongwei. Tel: +86-10-82545516, email: wangdw@nanoctr.cn
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